From: krw@nowhere.com   
      
   On Thu, 10 Mar 2016 15:41:21 -0800 (PST), "V."    
   wrote:   
      
   >What are the pros and cons between probing directly at a via and probing a   
   dedicated test pin?   
      
   Vias can be pretty small.  Test pads can be sized for the test   
   equipment.   
   >   
   >How does the design for testability need to change as signal frequencies are   
   in the higher ranges (> 100Mhz)? (ie: Probe types, reduction of overshoot,   
   ringing, etc...)   
      
   Generally, one doesn't test high frequency signals directly.  Either   
   test indirectly or measure device parametrics.   
   >   
   >Thank you for any advise!   
      
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